1999 Articles
Improved electron-beam ion-trap lifetime measurement of the Ne8+ 1s2s3S1 level
An earlier electron-beam ion-trap (EBIT) lifetime measurement of the Ne8+ 1s2s3S1 level has been improved upon, reducing the uncertainties to less than the scatter in the existing theoretical calculations. The new result, 91.7±0.4 μs, agrees with the previous value, but is more precise by a factor of 4. The new value distinguishes among theoretical values, as agreement is obtained only with those calculations that employ "exact" nonrelativistic or relativistic wave functions. Routes to measurements with even higher accuracy are discussed.
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Also Published In
- Title
- Physical Review A
- DOI
- https://doi.org/10.1103/PhysRevA.60.2034
More About This Work
- Academic Units
- Astronomy and Astrophysics
- Published Here
- March 29, 2013